SRS image stack workflow > Acquire Configuration >
7. SRS grid layout settings
Select Method for XY Scanning
- Exhaustive grid: Acquire image tiles that capture all of the selected regions of interest (i.e., without systematic random sampling).
- SRS grid: Employ systematic random sampling (SRS) to acquire representative sample images from across the selected regions of interest.
Define SRS Layout
Choose one of the following ways to define the SRS grid layout:
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Choose one of the following ways to define the SRS grid layout:
Grid size and counting frame size remain consistent throughout all of the sections for a given region of interest. The number of sites, however, may change because the grid is applied randomly every time you start a new probe run. Click Display Changes or Estimate Grid Size repeatedly to see how the grid is applied differently every time.
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Manually enter the grid size
- Type in values (µm) for X and Y grid spacing.
- Click Display Changes.
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Enter a percentage of the region of interest that you want to sample.
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Type the percent to sampled in the Percentage box.
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Click Display Changes
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Determine grid size based on number of sampling sites:
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Enter the desired number of sites in the Approximate Sites box.
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Click Estimate Grid Size.
This option is ideal if you don’t know your desired X and Y grid spacing. For instance, if you want to count a mean of 10 sites based on the current representative section, set the grid size to include approximately 10 counting frames in the region of interest.
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We recommend that you check the box to Round to increments of 1 micron or larger.
Undo my changes: Click to remove your input for this step and revert to the default values.